Technological platform for vertical multi-wafer integration of miniature imaging instruments

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TitreTechnological platform for vertical multi-wafer integration of miniature imaging instruments
Type de publicationConference Paper
Year of Publication2015
AuteursBargiel S., Baranski M., Passilly N., Gorecki C., Wiemer M., Froemel J., Wuensch D., Wang W-S.
EditorPiyawattanametha W, Park YH
Conference NameMOEMS AND MINIATURIZED SYSTEMS XIV
PublisherSPIE; Samsung Adv Inst Technol
Conference Location1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
ISBN Number978-1-62841-465-3
Mots-clés3-D scanning, Confocal microscopy, Imaging systems, Micro-optics, Microlens integration, Microlens Scanner, MOEMS, Multi-wafer Bonding, Optical Coherence Tomography, Vertical integration
Résumé

We describe a technological platform developed for miniaturization of optical imaging instruments, such as laser scanning confocal microscopes or Optical Coherence Tomography devices. The platform employs multi-wafer vertical integration approach, combined with integrated glass-based micro-optics and heterogeneous bonding and interconnecting technologies. In this paper we focus on the unconventional fabrication methods of monolithic micro-optical structures and components in borosilicate glass (e. g. micro beamsplitters, refractive microlenses) for optical beam shaping and routing. In addition, we present hybrid laser-assisted integration of glass ball microlenses on the silicon MEMS actuators for transmissive beam scanning as well as methods of electrical signals distribution through thick glass substrates, based on HF etched via holes.

DOI10.1117/12.2078007