Study of acetylene diluted in xenon by diode-laser spectroscopy: I. Temperature dependence of the broadening coefficients

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TitreStudy of acetylene diluted in xenon by diode-laser spectroscopy: I. Temperature dependence of the broadening coefficients
Type de publicationJournal Article
Year of Publication2014
AuteursDhyne M, Joubert P, Populaire J-C, Blanquet G, Lepere M
JournalJOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER
Volume144
Pagination174-181
Date PublishedSEP
Type of ArticleArticle
ISSN0022-4073
Mots-clésC2H2, Diode-laser, Pressure broadening, Temperature dependence
Résumé

In this paper, we present the Xe-broadening coefficients of 18 rovibrational lines in the v(4)+v(5) band of (C2H2)-C-12 (near 1330 cm(-1)) determined at five temperatures, ranging from 173.2 K to 298.2 K. The measurement of these coefficients was realized with a tunable diode-laser spectrometer. A low temperature cell was coupled with the spectrometer in order to determine their temperature dependence. The line parameters were obtained by fitting the experimental profiles by the Voigt lineshape and the Rautian and the Galatry models, which take into account the collisional narrowing. The results were compared with previous experimental data reporting for other vibrational bands and agree with them. This indicates that they are insensitive to vibrational excitation. (C) 2014 Published by Elsevier Ltd.

DOI10.1016/j.jqsrt.2014.03.007