Study of acetylene diluted in xenon by diode-laser spectroscopy: I. Temperature dependence of the broadening coefficients
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Titre | Study of acetylene diluted in xenon by diode-laser spectroscopy: I. Temperature dependence of the broadening coefficients |
Type de publication | Journal Article |
Year of Publication | 2014 |
Auteurs | Dhyne M, Joubert P, Populaire J-C, Blanquet G, Lepere M |
Journal | JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER |
Volume | 144 |
Pagination | 174-181 |
Date Published | SEP |
Type of Article | Article |
ISSN | 0022-4073 |
Mots-clés | C2H2, Diode-laser, Pressure broadening, Temperature dependence |
Résumé | In this paper, we present the Xe-broadening coefficients of 18 rovibrational lines in the v(4)+v(5) band of (C2H2)-C-12 (near 1330 cm(-1)) determined at five temperatures, ranging from 173.2 K to 298.2 K. The measurement of these coefficients was realized with a tunable diode-laser spectrometer. A low temperature cell was coupled with the spectrometer in order to determine their temperature dependence. The line parameters were obtained by fitting the experimental profiles by the Voigt lineshape and the Rautian and the Galatry models, which take into account the collisional narrowing. The results were compared with previous experimental data reporting for other vibrational bands and agree with them. This indicates that they are insensitive to vibrational excitation. (C) 2014 Published by Elsevier Ltd. |
DOI | 10.1016/j.jqsrt.2014.03.007 |