3D-IC: New Perspectives for a Digital Pixel Sensor

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Titre3D-IC: New Perspectives for a Digital Pixel Sensor
Type de publicationConference Paper
Year of Publication2016
AuteursBrochard N, Nebhen J, Ginhac D
Conference NameICDSC 2016: 10TH INTERNATIONAL CONFERENCE ON DISTRIBUTED SMART CAMERA
PublisherInst Pascal; CNRS; Lab Electronique Informatique Image; Cea Tech; Lab Excellence Innovat Mobil Smart & Sustainable Solut; nVIDIA; Colegio Espana
Conference Location1515 BROADWAY, NEW YORK, NY 10036-9998 USA
ISBN Number978-1-4503-4786-0
Mots-clés3D-IC, CMOS 130nm FaStack Tezzaron, Digital Pixel Sensor, Fill-Factor, Image sensor sensitivity, Multi-Channel-Bit-Serial
Résumé

Digital Pixel Sensors (DPS) are often unsuitable in the standard market due to large pixel size and low Fill-Factor (FF) in spite of several advantages like an early conversion. Nevertheless, the digital pixel represents presages of the ``smart'' pixel integrating maximum of processing in pixel level. It's for this reason that a special attention should be paid in this one. An elegant solution to compensate for the disadvantages of the DPS is to use an emergent three-dimension integration technology. So in this paper, an explanation of the sensitivity of image sensor is done highlighting the role of the fill-factor on this characteristic. Then a description of a particular digital pixel is described as well as a brief overview of different three-dimension integration methods. The digital pixel includes a photodiode, a Delta-Sigma Modulation (DSM) and a digital decimation filter. Finally, this paper presents an approach which combines a 3D technology, the CMOS (Complementary Metal Oxide Semi-conductor) 130nm 3D-IC FaStack Tezzaron technology, and the Multi-Channel-Bit-Serial (MCBS) method allowing the presented pixel to obtain a high fill-factor about 80% and a pixel pitch of 32.5 mu m

DOI10.1145/2967413.2967433