Covering both Stack and States while Testing Push-down Systems
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Titre | Covering both Stack and States while Testing Push-down Systems |
Type de publication | Conference Paper |
Year of Publication | 2015 |
Auteurs | Heam P-C, M'Hemdi H |
Conference Name | 2015 IEEE EIGHTH INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION WORKSHOPS (ICSTW) |
Publisher | IEEE; IEEE Comp Soc; Graz Univ Technol |
Conference Location | 345 E 47TH ST, NEW YORK, NY 10017 USA |
ISBN Number | 978-1-4799-1885-0 |
Mots-clés | Coverage criterion, Model based Testing, Push-down automaton |
Résumé | In this paper we address the problem of generating abstract test cases from a system modelled by a push-down automaton. Existing classical coverage criteria are based either on states, transitions or loops in the automaton. This paper is based on a known theoretical result claiming that the accessible stack configurations in a push-down automaton form a regular language. We propose a new coverage criteria based both on states and on the configurations of the stack. Experimental results on a model of the Shunting Yard Algorithm are also presented. |