Covering both Stack and States while Testing Push-down Systems

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TitreCovering both Stack and States while Testing Push-down Systems
Type de publicationConference Paper
Year of Publication2015
AuteursHeam P-C, M'Hemdi H
Conference Name2015 IEEE EIGHTH INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION WORKSHOPS (ICSTW)
PublisherIEEE; IEEE Comp Soc; Graz Univ Technol
Conference Location345 E 47TH ST, NEW YORK, NY 10017 USA
ISBN Number978-1-4799-1885-0
Mots-clésCoverage criterion, Model based Testing, Push-down automaton
Résumé

In this paper we address the problem of generating abstract test cases from a system modelled by a push-down automaton. Existing classical coverage criteria are based either on states, transitions or loops in the automaton. This paper is based on a known theoretical result claiming that the accessible stack configurations in a push-down automaton form a regular language. We propose a new coverage criteria based both on states and on the configurations of the stack. Experimental results on a model of the Shunting Yard Algorithm are also presented.