In-situ electrochemical atomic force microscopy study of aging of magnetron sputtered Pt-Co nanoalloy thin films during accelerated degradation test
| Affiliation auteurs | !!!! Error affiliation !!!! |
| Titre | In-situ electrochemical atomic force microscopy study of aging of magnetron sputtered Pt-Co nanoalloy thin films during accelerated degradation test |
| Type de publication | Journal Article |
| Year of Publication | 2016 |
| Auteurs | Khalakhan I, Vorokhta M, Vaclavu M, Smid B, Lavkova J, Matolinova I, Fiala R, Tsud N, Skala T, Matolin V |
| Journal | ELECTROCHIMICA ACTA |
| Volume | 211 |
| Pagination | 52-58 |
| Date Published | SEP 1 |
| Type of Article | Article |
| ISSN | 0013-4686 |
| Mots-clés | cyclic voltammetry, electrochemical AFM, Oxygen reduction reaction, Pt-Co, Thin Film |
| Résumé | A Pt-Co nanoalloy thin film catalyst was prepared by using simultaneous magnetron sputtering of Pt and Co. The catalyst was characterized during accelerated degradation test using in-situ electrochemical atomic force microscopy complemented with ex-situ techniques such as energy dispersive X-ray spectroscopy, X-ray photoelectron spectroscopy and synchrotron radiation photoelectron spectroscopy. The combined results gave the full step-by-step picture of the catalyst behavior during the aging test. (C) 2016 Elsevier Ltd. All rights reserved. |
| DOI | 10.1016/j.electacta.2016.06.035 |