Design, Characterization and Analysis of a 0.35 mu m CMOS SPAD

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TitreDesign, Characterization and Analysis of a 0.35 mu m CMOS SPAD
Type de publicationJournal Article
Year of Publication2014
AuteursJradi K, Pellion D, Ginhac D
JournalSENSORS
Volume14
Pagination22773-22784
Date PublishedDEC
Type of ArticleArticle
Mots-clésavalanche photodiodes (APDs), integrated optoelectronic circuits, optoelectronics, photodetectors, photonic integrated circuit
Résumé

Most of the works about single-photon detectors rely on Single Photon Avalanche Diodes (SPADs) designed with dedicated technological processes in order to achieve single-photon sensitivity and excellent timing resolution. Instead, this paper focuses on the implementation of high-performance SPADs detectors manufactured in a standard 0.35-micron opto-CMOS technology provided by AMS. We propose a series of low-noise SPADs designed with a variable pitch from 20 mu m down to 5 mu m. This opens the further way to the integration of large arrays of optimized SPAD pixels with pitch of a few micrometers in order to provide high-resolution single-photon imagers. We experimentally demonstrate that a 20-micron SPAD appears as the most relevant detector in terms of Signal-to-Noise ratio, enabling emergence of large arrays of SPAD.

DOI10.3390/s141222773