Design, Characterization and Analysis of a 0.35 mu m CMOS SPAD
Affiliation auteurs | !!!! Error affiliation !!!! |
Titre | Design, Characterization and Analysis of a 0.35 mu m CMOS SPAD |
Type de publication | Journal Article |
Year of Publication | 2014 |
Auteurs | Jradi K, Pellion D, Ginhac D |
Journal | SENSORS |
Volume | 14 |
Pagination | 22773-22784 |
Date Published | DEC |
Type of Article | Article |
Mots-clés | avalanche photodiodes (APDs), integrated optoelectronic circuits, optoelectronics, photodetectors, photonic integrated circuit |
Résumé | Most of the works about single-photon detectors rely on Single Photon Avalanche Diodes (SPADs) designed with dedicated technological processes in order to achieve single-photon sensitivity and excellent timing resolution. Instead, this paper focuses on the implementation of high-performance SPADs detectors manufactured in a standard 0.35-micron opto-CMOS technology provided by AMS. We propose a series of low-noise SPADs designed with a variable pitch from 20 mu m down to 5 mu m. This opens the further way to the integration of large arrays of optimized SPAD pixels with pitch of a few micrometers in order to provide high-resolution single-photon imagers. We experimentally demonstrate that a 20-micron SPAD appears as the most relevant detector in terms of Signal-to-Noise ratio, enabling emergence of large arrays of SPAD. |
DOI | 10.3390/s141222773 |