Visual Quality Inspection and Fine Anomalies: Methods and Application
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Titre | Visual Quality Inspection and Fine Anomalies: Methods and Application |
Type de publication | Conference Paper |
Year of Publication | 2014 |
Auteurs | Desage S-F, Pitard G, Pillet M, Favreliere H, Frelin F, Samper S, Le Goic G, Gwinner L, Jochum P |
Editor | Ratchev S |
Conference Name | PRECISION ASSEMBLY TECHNOLOGIES AND SYSTEMS, IPAS 2014 |
Publisher | Int Federat Informat Proc WG 5 5; Int Acad Prod Res; European Factory Automat Comm |
Conference Location | HEIDELBERGER PLATZ 3, D-14197 BERLIN, GERMANY |
ISBN Number | 978-3-662-45586-9; 978-3-662-45585-2 |
Mots-clés | Computer vision, Image processing, Quality inspection, Statistic, Surface metrology |
Résumé | This study develops a surface inspection methodology used to detect complex geometry products and metallic reflective surfaces imperfections. This work is based on combination of three complementary methods: an optical one (structured light information), an algorithmic one (data processing) and a statistical one (parameters processing). A usual industrial application illustrates this processing. |