Spatial correction in dynamic photon emission by affine transformation matrix estimation
| Affiliation auteurs | !!!! Error affiliation !!!! |
| Titre | Spatial correction in dynamic photon emission by affine transformation matrix estimation |
| Type de publication | Conference Paper |
| Year of Publication | 2014 |
| Auteurs | Chef S., Jacquir S., Perdu P., Sanchez K., Binczak S. |
| Conference Name | 2014 IEEE 21ST INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA) |
| Publisher | IEEE; FEI Co USA; IEEE Singapore Reliabl CPMT ED Chapter; Elect Devices Soc; Reliabl Soc |
| Conference Location | 345 E 47TH ST, NEW YORK, NY 10017 USA |
| ISBN Number | 978-1-4799-3929-9 |
| Résumé | Photon emission microscopy and Time Resolved Imaging have proved their efficiency for defect localization on VLSI. A common process to find defect candidate locations is to draw a comparison between acquisitions on a normally working device and a faulty one. In order to be accurate and meaningful, this method requires that the acquisition scene remains the same between the two parts. In practice, it can be difficult to set. In this paper, a method to correct position by affine matrix transformation is suggested. It is based on image features detection, description and matching and affine transformation estimation. |