Deviation from threshold model in ultrafast laser ablation of graphene at sub-micron scale
| Affiliation auteurs | !!!! Error affiliation !!!! |
| Titre | Deviation from threshold model in ultrafast laser ablation of graphene at sub-micron scale |
| Type de publication | Journal Article |
| Year of Publication | 2015 |
| Auteurs | Gil-Villalba A., Xie C., Salut R., Furfaro L., Giust R., Jacquot M., Lacourt P.A, Dudley J.M, Courvoisier F. |
| Journal | APPLIED PHYSICS LETTERS |
| Volume | 107 |
| Pagination | 061103 |
| Date Published | AUG 10 |
| Type of Article | Article |
| ISSN | 0003-6951 |
| Résumé | We investigate a method to measure ultrafast laser ablation threshold with respect to spot size. We use structured complex beams to generate a pattern of craters in CVD graphene with a single laser pulse. A direct comparison between beam profile and SEM characterization allows us to determine the dependence of ablation probability on spot-size, for crater diameters ranging between 700 nm and 2.5 mu m. We report a drastic decrease of ablation probability when the crater diameter is below 1 mu m which we interpret in terms of free-carrier diffusion. (C) 2015 AIP Publishing LLC. |
| DOI | 10.1063/1.4928391 |