Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory
| Affiliation auteurs | !!!! Error affiliation !!!! |
| Titre | Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory |
| Type de publication | Conference Paper |
| Year of Publication | 2017 |
| Auteurs | Boscaro A., Jacquir S., Sanchez K., Perdu P., Binczak S. |
| Conference Name | 2017 20TH INTERNATIONAL CONFERENCE ON INFORMATION FUSION (FUSION) |
| Publisher | Xian Jiaotong Univ; Int Soc Informat Fus; SATPRO; CEEC; China Gezhouba Grp No 3 Engn Co Ltd; Minist Educ, Key Lab Informat Fus Technol; Hangzhou Dianzi Univ; China Elect Technol Grp Corp, Sci & Technol Informat Syst Engn Lab, 28 Res Inst; China Elect Tech |
| Conference Location | 345 E 47TH ST, NEW YORK, NY 10017 USA |
| ISBN Number | 978-0-9964-5270-0 |
| Mots-clés | evidence theory, Fault detection and identification, Multi-sensor data fusion, VLSI analysis |
| Résumé | Defect localization in Very Large Integration Circuits (VLSI) requires to use multi-sensor information such as electrical waveforms, emission microscopy images and frequency mapping in order to detect, localize and identify the failure. Each sensor provides a specific kind of feature modeling the evidence. Thus, the defect localization in VLSI can be summarized as a problem of data fusion with heterogeneous and imprecise information. This study illustrates how to reproduce the human decision for modeling and fusing the different multi-sensor features by using the Demspter-Shafer theory. We propose not only an automatic decision rule for mass functions computing but also confidence intervals to quantify the final decision and to bring a decision help for the analysts expertise. Finally, a case of study is reported to attest the expert decision reproducibility. |