Experimental Investigation of Emissivity Influence to Obtain Thermal Field by Near Infrared Thermography
Affiliation auteurs | !!!! Error affiliation !!!! |
Titre | Experimental Investigation of Emissivity Influence to Obtain Thermal Field by Near Infrared Thermography |
Type de publication | Conference Paper |
Year of Publication | 2019 |
Auteurs | Zhang C., Marty J., Maynadier A., Chaudet P., Rethore J., Baietto M-C |
Editor | Baldi A, Quinn S, Balandraud X, DulieuBarton JM, Bossuyt S |
Conference Name | RESIDUAL STRESS, THERMOMECHANICS & INFRARED IMAGING, HYBRID TECHNIQUES AND INVERSE PROBLEMS, VOL 7 |
Publisher | Soc Experimental Mech |
Conference Location | GEWERBESTRASSE 11, CHAM, CH-6330, SWITZERLAND |
ISBN Number | 978-3-319-95074-7; 978-3-319-95073-0 |
Mots-clés | Emissivity, Near Infrared, Radiometric model, Silicon camera, Thermography |
Résumé | Thermal fields are usually obtained by infrared camera (operating in 3-12 mu m). However, the infrared cameras are expensive, fragile and low resolution, thus the infrared camera is more used for laboratory researches. Nowadays, silicon based sensor camera has been widely used to perform real-time observation of the kinematic fields, mainly thanks to digital image correlation or interferometry. Silicon-based camera is also sensitive in the near infrared spectral ranges (operating in 0.7-1.1 mu m). An automatic prediction of the camera exposure time is developed and presented in this paper to follow the surface emissivity of the sample and avoid saturation of the gray level. |
DOI | 10.1007/978-3-319-95074-7_6 |